Publikationen

An ultrahigh vacuum system for in situ studies of thin films and nanostructures by nuclear resonance scattering of synchrotron radiation

Autor(en)
Svetoslav Stankov, Rudolf Rüffer, Marcel Sladecek, Marcus Rennhofer, Bogdan Sepiol, Gero Vogl, Nika Spiridis, Tomasz Slezak, Jozef Korecki
Abstrakt

A multifunctional ultrahigh vacuum (UHV) system has been set up at the nuclear resonance

beamline ID18 of the European Synchrotron Radiation Facility (ESRF). Thin and ultrathin films,

nanoislands and -wires, multilayers, and stoichiometric oxides can be prepared by molecular beam epitaxy and characterized by low-energy electron diffraction, Auger electron spectroscopy, and

reflection high-energy electron diffraction. Upon characterization the sample is transferred under

UHV conditions to the chamber for experiments with the synchrotron beam. Electronic and

magnetic properties, vibrational dynamics, and diffusion phenomena can be investigated by several

synchrotron radiation based techniques, such as nuclear forward scattering, nuclear inelastic and

quasielastic scattering, synchrotron radiation based perturbed angular correlations, and nuclear and

electronic reflectivity. In addition, two portable UHV chambers serve to transfer the sample to other

beamlines profiting from the available experimental techniques at the ESRF.

Organisation(en)
Dynamik Kondensierter Systeme, Institut für Funktionelle Materialien und Katalyse
Externe Organisation(en)
European Synchrotron Radiation Facility ESRF, Polish Academy of Sciences (PAS), AGH University of Science and Technology
Journal
Review of Scientific Instruments
Band
79
Anzahl der Seiten
6
ISSN
0034-6748
DOI
https://doi.org/10.1063/1.2906321
Publikationsdatum
2008
Peer-reviewed
Ja
ÖFOS 2012
103015 Kondensierte Materie
Link zum Portal
https://ucris.univie.ac.at/portal/de/publications/an-ultrahigh-vacuum-system-for-in-situ-studies-of-thin-films-and-nanostructures-by-nuclear-resonance-scattering-of-synchrotron-radiation(5923392c-8a0e-49a7-a585-459998499ca9).html