Coherent x-ray diffraction imaging of grown-in antiphase boundaries in Fe₆₅ Al₃₅

Author(s)

Lorenz-Mathias Stadler, Ross Harder, Ian K. Robinson, Christian Rentenberger, Hans-Peter Karnthaler, Bogdan Sepiol, Gero Vogl

Abstract

Coherent x-ray diffraction has been used to image grown-in antiphase boundaries (APB's) in a metal alloy, which represent pure phase objects. The fine structure within the (001) superstructure diffraction peak of a B2 -ordered bulk Fe₆₅ Al₃₅ sample was inverted by means of iterative algorithms that Fourier transform between reciprocal and real space, applying appropriate constraints in each domain. Since the sample object is noncompact, bigger than the beam footprint, knowing the precise beam profile was essential to define the real-space constraint. Even though a unique long-range structure could not be derived, the algorithm found phase structures that were locally unique. These were identified in all reconstruction runs by means of a cross-correlation analysis. The obtained characteristic APB morphology is confirmed by transmission electron microscopy results from the same sample, revealing nearly planar APB walls on {110} planes terminating at grown-in dislocations. © 2007 The American Physical Society.

Organisation(s)

Dynamics of Condensed Systems, Physics of Nanostructured Materials

External organisation(s)

Illinois State University

Journal

Physical Review B

Volume

76

No. of pages

9

ISSN

1098-0121

DOI

https://doi.org/10.1103/PhysRevB.76.014204

Publication date

2007

Peer reviewed

Yes

Austrian Fields of Science 2012

103015 Condensed matter

Portal url

https://ucrisportal.univie.ac.at/en/publications/cce17bad-3ecb-48e0-99a1-9f45d8e6d375